Synthesis of locally exhaustive test pattern generators
نویسنده
چکیده
Optirnized locally exlzaustive test patterti yetietators bused on linear sunis promise a low overhead, bur ha\,e an irregular structure. The puper presents a new 0180t.ithm able to compute the linear sunis fo r real circuiis up to several h i d r e d s of inputs arid outpurs. The idea is to substitute a strategy of introducing fresh variables irito an array of sums fo r the former linear independence test. This reduces the complexity of the calculatioti on an enornious scale. Experinierits with several hundred raridomly selected cone srrucmres allow the rough estimatiori that the so conipuied generators are oti a v e t q e smaller ihari sh$ register bused oiies f the number of equal size cones is tiot larger thuti the tiumber of iriputs o f the circuit under tesr.
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